论文标题
量子引用的自发发射断层扫描
Quantum-Referenced Spontaneous Emission Tomography
论文作者
论文摘要
我们提出了一种层析成像方法,该方法可以测量自发发射的光子对的联合光谱阶段(JSP),该光子对源自未经表征的``目标''来源。我们使用目标源和参考源之间的量子干扰来用四个光谱分辨的测量来提取JSP,以四个频谱分辨的测量进行了呼叫量子量的测量方法,我们将量子化量化量化量化量表,并启用了这种方法。目标微环谐振器光子对源的集成电路表明,从微环谐振器中自发发射的光子对与刺激发射的光子对截然不同,因此通常无法使用经典刺激的发射层析成像在没有详细知识的情况下使用经典刺激的发射层析成像来完全表征。
We present a method of tomography that measures the joint spectral phase (JSP) of spontaneously emitted photon pairs originating from a largely uncharacterized ``target" source. We use quantum interference between our target source and a reference source to extract the JSP with four spectrally resolved measurements, in a process that we call quantum-referenced spontaneous emission tomography (Q-SpET). We have demonstrated this method on a photonic integrated circuit for a target micro-ring resonator photon-pair source. Our results show that spontaneously emitted photon pairs from a micro-ring resonator are distinctively different from that of stimulated emission, and thus cannot in general be fully characterized using classical stimulated emission tomography without detailed knowledge of the source.