论文标题
高度散射双向样品的介电调节器重建
Dielectric-tensor reconstruction of highly scattering birefringent samples
论文作者
论文摘要
许多重要的显微镜样品,例如液晶,生物组织或淀粉,本质上都是双折的。它们取决于光的极化和分子取向,它们的散射不同。双重样本的完整表征是一项具有挑战性的任务,因为必须在每个三维位置重建其3 x 3介电张量。此外,对于厚的样品,获得双折射断层图更加艰巨,其中还应考虑多个光散射。在这项研究中,我们开发了一种新的介电张量层析成像算法,该算法可以通过解决多个光散射来解决高度散射双折射样品的全面表征。我们提出了一个离散的图像处理理论,以计算矢量衍射光的误差反射。最后,使用合成和生物学上的双向样品,在实验上证明了我们的理论。
Many important microscopy samples, such as liquid crystals, biological tissue, or starches, are birefringent in nature. They scatter light differently depending on the light polarization and molecular orientations. The complete characterization of a birefringent sample is a challenging task because its 3 x 3 dielectric tensor must be reconstructed at every three-dimensional position. Moreover, obtaining a birefringent tomogram is more arduous for thick samples, where multiple light scattering should also be considered. In this study, we developed a new dielectric tensor tomography algorithm that enables full characterization of highly scattering birefringent samples by solving the vectoral inverse scattering problem considering multiple light scattering. We proposed a discrete image-processing theory to compute the error backpropagation of vectorially diffracting light. Finally, our theory was experimentally demonstrated using both synthetic and biologically birefringent samples.