论文标题
多孔硅的接触角研究：异质润湿的证据和氧化的影响
Contact Angle Studies on Porous Silicon: Evidence for Heterogeneous Wetting and Implications of Oxidation
论文作者
论文摘要
对毛孔直径的多孔硅膜进行了润湿的研究，涉及三个数量级。与特定表面积相关的预期相比，相邻多孔和非孔区域的水接触角度测量产生的wenzel粗糙度比是非物理（小于统一）或不切实际的较低的。此外，从大孔层上的微孔膜组成的样品获得的结果给出了与仅由单个微孔层组成的膜中发现的触点，这与液体完全填充毛孔的预期相反。考虑到它们的孔隙率的微型，中，中，中，中，中，中，中，中，中，中，中，中，中，中，中，中，中，中，中，中氧化和氧化的大孔膜的润湿表面分数的值是不合理的，而相对无氧化物的巨孔膜则可以根据膜孔隙率的预期提供湿润的表面馏分。总的来说，这些结果表明，在这些薄膜上润湿的主要模式是异质的。
A study of wetting was carried out on porous silicon films with pore diameters spanning three orders of magnitude. Water contact angle measurements on adjoining porous and nonporous regions yielded Wenzel roughness ratios that were either unphysical (less than unity) or unrealistically low when compared to those expected from specific surface area considerations. Moreover, results obtained from a sample consisting of a microporous film on a macroporous layer gave contact angles that were very similar to those found on films consisting of only a single microporous layer, contrary to what would be expected for complete filling of the pores by liquid. Values for wetted surface fractions calculated from the Cassie-Baxter model are unreasonably high for micro- , meso- and oxidized macroporous films considering their porosities, while relatively oxide-free macroporous films give wetted surface fractions in accord with those expected based on film porosity. Collectively, these results show that the predominant mode of wetting on these films is heterogeneous.
