论文标题

介电薄膜高谐波产生的传播效应

Propagation effects in high-harmonic generation from dielectric thin films

论文作者

Yamada, Shunsuke, Otobe, Tomohito, Freeman, David, Kheifets, Anatoli, Yabana, Kazuhiro

论文摘要

理论研究是在硅薄膜中对高阶谐波产生(HHG)进行的,以阐明反射和透射波中光传播的影响。第一原理模拟是对强烈的脉冲光照射硅薄膜的过程进行的,最大厚度为3 $ m $ m。我们的模拟携带在时间依赖性密度功能理论(TDDFT)中,该理论是电磁场的耦合动力学和电子运动的耦合动力学。发现传播HHG的强度随厚度逐渐降低,而反射HHG由于某个厚度而变为恒定。详细的分析表明,传输HHG具有两个起源:在前边缘附近生成的HHG并传播到后表面,并在后边缘附近生成并直接发射。发现传输HHG的主导机制取决于薄膜的厚度和HHG的频率。在1 $ $ m m的膜厚度下,频率低于20 eV的传输HHG在后边缘附近产生,而频率高于20 eV的频率是在前边缘附近产生的,并从那里传播到后表面。

Theoretical investigation is conducted of high-order harmonic generation (HHG) in silicon thin films to elucidate the effect of light propagation in reflected and transmitted waves. The first-principles simulations are performed of the process in which an intense pulsed light irradiates silicon thin films up to 3 $μ$m thickness. Our simulations are carried within the time-dependent density functional theory (TDDFT) with the account of coupled dynamics of the electromagnetic fields and the electronic motion. It was found that the intensity of transmission HHG gradually decreases with the thickness, while the reflection HHG becomes constant from a certain thickness. Detailed analyses show that transmission HHG have two origins: the HHG generated near the front edge and propagating to the back surface, and that generated near the back edge and emitted directly. The dominating mechanism of the transmission HHG is found to depend on the thickness of the thin film and the frequency of the HHG. At the film thickness of 1 $μ$m, the transmission HHG with the frequency below 20 eV is generated near the back edge, while that with the frequency above 20 eV is generated near the front edge and propagates from there to the back surface.

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