论文标题
在Fabry-Pérot等基于仪器上。 iv。远导etalons的分析公式
On Fabry-Pérot etalon-based instruments. IV. Analytical formulation of telecentric etalons
论文作者
论文摘要
Fabry-Pérot等人用准直梁照亮了自发明以来的分析表征。同时,尽管在天体物理仪器中广泛使用了这种配置数十年来,但位于电信平面中的大多数特征才进行了数值研究。在这项工作中,我们介绍了对传输电场及其衍生物的分析表达式,这些表达式对放置在慢速远镜梁中的Etalon有效,例如太阳能仪器中通常使用的梁。我们使用衍生物来推断电场的敏感性对入射光束的不同反射性和光圈的光学厚度的变化,并将其与准确的情况进行比较。这使我们能够估计Fabry-Pérot表面上的粗糙度误差产生的波前降解,并在Etalon的入射光束上建立了腔体不规则的最大允许的RMS值,以确保衍射限制的性能。我们还评估了这些安装座的固有的波前降解,仅由梁的有限孔产生,并且必须将其添加到缺陷产生的一个。最后,我们讨论了基于Etalon的仪器的性能差异,并将我们的配方推广到各向异性Etalons。
Fabry-Pérot etalons illuminated with collimated beams have been characterized analytically in detail since their invention. Meanwhile, most of the features of etalons located in telecentric planes have been studied only numerically, despite the wide use of this configuration in astrophysical instrumentation over decades. In this work we present analytical expressions for the transmitted electric field and its derivatives that are valid for etalons placed in slow telecentric beams, like the ones commonly employed in solar instruments. We use the derivatives to infer the sensitivity of the electric field to variations in the optical thickness for different reflectivities and apertures of the incident beam and we compare them to the collimated case. This allows us to estimate the wavefront degradation produced by roughness errors on the surfaces of the Fabry-Pérot and to establish the maximum allowed RMS value of the cavity irregularities across the footprint of the incident beam on the etalon that ensures diffraction-limited performance. We also evaluate the wavefront degradation intrinsic to these mounts, which is produced only by the finite aperture of the beam and that must be added to the one produced by defects. Finally, we discuss the differences in performance of telecentric and collimated etalon-based instruments and we generalize our formulation to anisotropic etalons.