论文标题
界面空化
Interfacial Cavitation
论文作者
论文摘要
长期以来,空化已被公认为是各种材料的最终故障的关键预测因子或前体,从延性金属到软材料。传统上,固体中的空化被定义为材料中空隙或缺陷的不稳定膨胀。触发这种不稳定性所需的关键施加载荷 - 临界压力 - 是长度尺寸的独立材料特性,已经通过许多理论研究来预测构成模型的广度。尽管这些研究通常假定从大部分均质培养基中的缺陷中引发空化,但如果在体内两个不同的介质之间的接口处发现缺陷,则可能会发生一种替代性和潜在无处不在的情况。通过使用多材料复合材料和按层添加剂制造方法,这种接口在现代材料中变得越来越普遍。然而,尚未报道确定界面故障阈值的标准,类似于散装空化极限。在这项工作中,我们填补了这一空白。我们的理论模型捕获了界面空化的长度独立限制,并显示通过两个不同的实验系统在两个不同的长度尺度上的观察结果一致。为了进一步了解两种空化模式之间的竞争(散装与界面),我们将研究扩展到弹性响应之外,以了解接口处随之而来的不稳定分层的不稳定传播。相图总结了这些结果,显示了界面故障成为主要机制的机制。
Cavitation has long been recognized as a crucial predictor, or precursor, to the ultimate failure of various materials, ranging from ductile metals to soft and biological materials. Traditionally, cavitation in solids is defined as an unstable expansion of a void or a defect within a material. The critical applied load needed to trigger this instability - the critical pressure - is a lengthscale independent material property and has been predicted by numerous theoretical studies for a breadth of constitutive models. While these studies usually assume that cavitation initiates from defects in the bulk of an otherwise homogeneous medium, an alternative and potentially more ubiquitous scenario can occur if the defects are found at interfaces between two distinct media within the body. Such interfaces are becoming increasingly common in modern materials with the use of multi-material composites and layer-by-layer additive manufacturing methods. However, a criterion to determine the threshold for interfacial failure, in analogy to the bulk cavitation limit, has yet to be reported. In this work we fill this gap. Our theoretical model captures a lengthscale independent limit for interfacial cavitation, and is shown to agree with our observations at two distinct lengthscales, via two different experimental systems. To further understand the competition between the two cavitation modes (bulk versus interface) we expand our investigation beyond the elastic response to understand the ensuing unstable propagation of delamination at the interface. A phase diagram summarizes these results, showing regimes in which interfacial failure becomes the dominant mechanism.