论文标题
2D材料的纳米力学光谱
Nanomechanical spectroscopy of 2D materials
论文作者
论文摘要
我们引入了一个纳米力学平台，用于快速，敏感的测量2D材料的光谱光学介电函数。我们方法的核心是悬挂的2D材料，该材料集成到由波长可触发激光源照明的纳米力学谐振器中。从与光子能量的函数测量的谐振器的加热相关频移以及其光学反射，我们获得了介电函数的真实和虚构部分。我们的测量值不受底物相关筛选的影响，并且不需要对底部光学常数的任何假设。这个快速（$τ_{rise} $ $ \ sim $ 135 ns），敏感（噪声等效= 90 $ \ frac {pW} {\ sqrt {hz}} $）和宽带（1.2 $ - $ 3.1 ev，可扩展到UV-THZ方法，可为spectroscors for spectroscosic septriquess提供一个诱人的功能。
We introduce a nanomechanical platform for fast and sensitive measurements of the spectrally-resolved optical dielectric function of 2D materials. At the heart of our approach is a suspended 2D material integrated into a nanomechanical resonator illuminated by a wavelength-tunable laser source. From the heating-related frequency shift of the resonator as well as its optical reflection measured as a function of photon energy, we obtain the real and imaginary parts of the dielectric function. Our measurements are unaffected by substrate-related screening and do not require any assumptions on the underling optical constants. This fast ($τ_{rise}$ $\sim$ 135 ns), sensitive (noise-equivalent power = 90 $\frac{pW}{\sqrt{Hz}}$ ), and broadband (1.2 $-$ 3.1 eV, extendable to UV-THz) method provides an attractive alternative to spectroscopic or ellipsometric characterisation techniques.
