论文标题
量化粘附细胞中的主动和电阻应力
Quantifying active and resistive stresses in adherent cells
论文作者
论文摘要
要了解细胞迁移，至关重要的是要了解细胞如何在环境上施加和整合力。对细胞运动建模感兴趣的生物物理学家的一定数量是细胞内应力。到目前为止，已经提出了三种不同的方法来计算它，它们都处于薄板近似状态。两个基于求解细胞材料内部的机械平衡方程（单层应力显微镜和贝叶斯推理应力显微镜），一个基于细胞/底物界面（细胞内应力显微镜）处位移的连续性。我们在这里使用3D FEM模型显示，这些技术不计算相同的数量（如前所述），第一技术计算细胞内的有源和电阻应力的总和，而最后一个技术仅计算电阻分量。将这些技术组合起来应该原则上允许仅访问主动压力。
To understand cell migration, it is crucial to gain knowledge on how cells exert and integrate forces on/from their environment. A quantity of prime interest for biophysicists interested in cell movements modeling is the intracellular stresses. Up to now, three different methods have been proposed to calculate it, they are all in the regime of the thin plate approximation. Two are based on solving the mechanical equilibrium equation inside the cell material (Monolayer Stress Microscopy, and Bayesian Inference Stress Microscopy) and one is based on the continuity of displacement at the cell/substrate interface (Intracellular Stress Microscopy). We show here using 3D FEM modeling that these techniques do not calculate the same quantities (as was previously assumed), the first techniques calculate the sum of the active and resistive stresses within the cell, whereas the last one only calculate the resistive component. Combining these techniques should in principle permit to get access to the active stress alone.
