论文标题
使用拉曼光谱和深度学习来识别石墨烯的电荷密度和介电环境
Identifying charge density and dielectric environment of graphene using Raman spectroscopy and deep learning
论文作者
论文摘要
环境对石墨烯特性(例如应变,电荷密度和介电环境)的影响可以通过拉曼光谱法评估。这些环境相互作用并非微不足道,因为它们以重叠的方式影响光谱。通常使用数据预处理(例如背景减法和峰值拟合)。此外,由于不同的实验设置和环境,收集的光谱数据有所不同。这种变化,伪影和环境差异在准确的光谱分析中构成了挑战。在这项工作中,我们开发了一个深度学习模型,以克服这种变化的影响并根据不同的电荷密度和介电环境对石墨烯拉曼光谱进行分类。我们考虑两种方法:深度学习模型和机器学习算法,以对略有不同的电荷密度或介电环境进行分类。这两种方法显示出高信噪比数据的成功率相似。但是,深度学习模型对噪声不太敏感。为了提高所有模型的准确性和概括,我们通过添加噪声和峰值变化来使用数据增强。我们使用卷积神经网(CNN)模型以99%的精度证明了光谱分类。 CNN模型能够以不同的电荷掺杂水平对石墨烯的拉曼光谱进行分类,甚至可以在SIO $ _2 $上的石墨烯和石墨烯之间的光谱和硅烷化Sio $ _2 $上的石墨烯分类。我们的方法有可能快速,可靠地估计石墨烯掺杂水平和介电环境。提出的模型为实现有效的分析工具铺平了方法来评估石墨烯的性质。
The impact of the environment on graphene's properties such as strain, charge density, and dielectric environment can be evaluated by Raman spectroscopy. These environmental interactions are not trivial to determine, since they affect the spectra in overlapping ways. Data preprocessing such as background subtraction and peak fitting is typically used. Moreover, collected spectroscopic data vary due to different experimental setups and environments. Such variations, artifacts, and environmental differences pose a challenge in accurate spectral analysis. In this work, we developed a deep learning model to overcome the effects of such variations and classify graphene Raman spectra according to different charge densities and dielectric environments. We consider two approaches: deep learning models and machine learning algorithms to classify spectra with slightly different charge density or dielectric environment. These two approaches show similar success rates for high Signal-to-Noise data. However, deep learning models are less sensitive to noise. To improve the accuracy and generalization of all models, we use data augmentation through additive noise and peak shifting. We demonstrated the spectra classification with 99% accuracy using a convolutional neural net (CNN) model. The CNN model is able to classify Raman spectra of graphene with different charge doping levels and even subtle variation in the spectra between graphene on SiO$_2$ and graphene on silanized SiO$_2$. Our approach has the potential for fast and reliable estimation of graphene doping levels and dielectric environments. The proposed model paves the way for achieving efficient analytical tools to evaluate the properties of graphene.