论文标题

基于伪磁化的磁电存储设备

A Magnetoelectric Memory Device Based on Pseudo-Magnetization

论文作者

Shen, Tingting, Hassan, Orchi, Dilley, Neil R., Camsari, Kerem Y., Appenzeller, Joerg

论文摘要

我们提出了一种新型的磁性存储器设备,该设备存储磁性易于轴信息或伪磁化,而不是在压电/铁磁(PE/FM)异质结构中的确定磁化方向。从理论上讲,我们展示了PE/FM组合如何导致表现出类似铁电行为的伪磁化化的非挥发性。伪磁化可以通过极低的电压来操纵,尤其是当FM是低障碍纳米磁铁时。使用针对实验的电路模型基准测试,我们根据磁性和电路参数确定了设想的1T/1C存储器设备的开关能量,延迟,切换概率和保留时间,并根据称为反向速率VM的关键参数来讨论其热稳定性,这是对应变磁场的电气测量。利用铁电磁共振(FMR)测量,我们在PB(MG1/3NB2/3)0.7TI0.3O3(PMN-PT)中实验提取VM的VM值和圆形纳米磁通量,这些值与理论值一致。我们的实验发现确实表明了所提出的新型设备的可行性,并在我们的建模工作中确认了假定的参数。

We propose a new type of magnetoelectric memory device that stores magnetic easy-axis information or pseudo-magnetization, rather than a definite magnetization direction, in piezoelectric/ferromagnetic (PE/FM) heterostructures. Theoretically, we show how a PE/FM combination can lead to non-volatility in pseudo-magnetization exhibiting ferroelectric-like behavior. The pseudo-magnetization can be manipulated by extremely low voltages especially when the FM is a low-barrier nanomagnet. Using a circuit model benchmarked against experiments, we determine the switching energy, delay, switching probability and retention time of the envisioned 1T/1C memory device in terms of magnetic and circuit parameters and discuss its thermal stability in terms of a key parameter called back-voltage vm which is an electrical measure of the strain-induced magnetic field. Taking advantage of ferromagnetic resonance (FMR) measurements, we experimentally extract values for vm in CoFeB films and circular nano-magnets deposited on Pb(Mg1/3Nb2/3)0.7Ti0.3O3 (PMN-PT) which agree well with the theoretical values. Our experimental findings indeed indicate the feasibility of the proposed novel device and confirm the assumed parameters in our modeling effort.

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