论文标题
热电学的波动散落
Fluctuation-Dissipation in Thermoelectrics
论文作者
论文摘要
热电材料表现出电荷和热量的相关运输。 Johnson-Nyquist噪声公式$ 4 k_b t r $用于电压波动的光谱密度是仅与欧姆耗散相关的波动。 Applying the fluctuation-dissipation theorem, we generalize the Johnson-Nyquist formula for thermoelectrics, finding an enhanced voltage fluctuation spectral density $4 k_B T R (1 + ZT)$ at frequencies below a thermal cut-off frequency $f_T$, where $ZT$ is the dimensionless thermoelectric material figure of merit.电压噪声增强的起源是温度波动的热电耦合。我们使用宽带（$ f_t \ sim1 $ kHz），集成的热电微设备在实验上确认我们的发现。测量$ ZT $增强的电压噪声，我们通过实验解决温度波动，幅度为$ 0.8〜μ \ MathRM {K} \ MathRM {k} \ MathRM {Hz}^{ - 1/2} $平均温度在295 K中，我们可以通过295 k的温度来实现热能设备，以实现热电设备的效果，以实现热电设备的构图，以供应供应，以供您的热电设备进行构图，以供您进行热电学的构图。波动 - 散落定理。
Thermoelectric materials exhibit correlated transport of charge and heat. The Johnson-Nyquist noise formula $ 4 k_B T R $ for spectral density of voltage fluctuations accounts for fluctuations associated solely with Ohmic dissipation. Applying the fluctuation-dissipation theorem, we generalize the Johnson-Nyquist formula for thermoelectrics, finding an enhanced voltage fluctuation spectral density $4 k_B T R (1 + ZT)$ at frequencies below a thermal cut-off frequency $f_T$, where $ZT$ is the dimensionless thermoelectric material figure of merit. The origin of the enhancement in voltage noise is thermoelectric coupling of temperature fluctuations. We use a wideband ($f_T\sim1$ kHz), integrated thermoelectric micro-device to experimentally confirm our findings. Measuring the $ZT$ enhanced voltage noise, we experimentally resolve temperature fluctuations with an amplitude of $0.8~μ\mathrm{K} \mathrm{Hz}^{-1/2}$ at a mean temperature of 295 K. We find that thermoelectric devices can be used for thermometry with sufficient resolution to measure the fundamental temperature fluctuations described by the fluctuation-dissipation theorem.
