论文标题
识别和理解perovskites的缺陷光电设备的积极影响
Identifying and understanding the positive impact of defects for perovskites optoelectronic devices
论文作者
论文摘要
通常认为缺陷会对材料中的载体重组，电荷传输和离子迁移产生负面影响，从而降低了光电设备的效率，速度和稳定性。同时，许多集中于最小化缺陷的努力极大地改善了设备的性能。那么，在光电设备中，缺陷会阳性吗？在此，依靠对半导体中缺陷相关效应的深入了解，将光电载体捕获在缺陷中捕获，以增强光电检测中的光导数增益。因此，在该光电探测器中达到了创纪录的光电加成，增益带宽产物和检测极限。超过了缺陷有害的一般概念，我们确定了一种新观点，即缺陷在光电检测中可能是正面的，这可能指导我们设计高性能的光电探测器。
Defects are generally regarded to have negative impacts on carrier recombination, charge-transport and ion migration in materials, which thus lower the efficiency, speed and stability of optoelectronic devices. Meanwhile, lots of efforts which focused on minimizing defects have greatly improved the performances of devices. Then, can defects be positive in optoelectronic devices? Herein, relying on in-depth understanding of defect-associated effects in semiconductors, trapping of photo-generated carriers by defects is applied to enlarge photoconductive gain in photodetection. Therefore, the record photoconductive gain, gain-bandwidth product and detection limit were achieved in this photodetector. Exceeding the general concept that defects are harmful, we identify a new view that the defects can be positive in photodetection, which may guide us to design high-performance photodetectors.
