论文标题
指数前电压expent作为现场发射理论的敏感测试参数
The pre-exponential voltage-exponent as a sensitive test parameter for field emission theories
论文作者
论文摘要
对于场电子发射（Fe），测得的电流I_M作为测量电压V_M的函数的经验方程的形式为I_M = C*（V_M）^K*EXP [-b/（V_M）]，其中B是常数，C和K是常数或与V_M弱变化。可以根据某些特定的FE理论从模拟中提取K值（a），从原则上（b）中提取了质量足够高的当前电压测量值（b）。本文表明，理论得出和实验得出的k值的比较可以提供一种敏感且有用的工具，用于比较Fe理论和实验，以及在替代理论之间进行选择。讨论了从实验或模拟电流 - 电压数据中提取K值的现有方法，包括现代化的“最小残留”方法，并总结了有关K值的现有知识。报告了探索性模拟。如果独立知道K的分析结果，则可靠提取该值。更一般而言，提取的K值对所使用的发射理论的细节敏感，但也取决于假定的发射极形状。未来的研究将需要解决这两个影响，并且一系列发射极形状需要检查。报告了其他程序结论。指出了该新工具可能能够帮助调查的一些科学问题。
For field electron emission (FE), an empirical equation for measured current I_m as a function of measured voltage V_m has the form I_m = C*(V_m)^k*exp[-B/(V_m)], where B is a constant and C and k are constants or vary weakly with V_m. Values for k can be extracted (a) from simulations based on some specific FE theory, and in principle (b) from current-voltage measurements of sufficiently high quality. This paper shows that comparison of theoretically derived and experimentally derived k-values could provide a sensitive and useful tool for comparing FE theory and experiment, and for choosing between alternative theories. Existing methods of extracting k-values from experimental or simulated current-voltage data are discussed, including a modernised "least residual" method, and existing knowledge concerning k-values is summarised. Exploratory simulations are reported. Where an analytical result for k is independently known, this value is reliably extracted. More generally, extracted k-values are sensitive to details of the emission theory used, but also depend on assumed emitter shape; these two influences will need to be disentangled by future research, and a range of emitter shapes will need examination. Other procedural conclusions are reported. Some scientific issues that this new tool may be able to help investigate are indicated.
