论文标题

使用随机基准测试在超导QUTRIT中对控制的表征

Characterization of Control in a Superconducting Qutrit Using Randomized Benchmarking

论文作者

Kononenko, M., Yurtalan, M. A., Ren, S., Shi, J., Ashhab, S., Lupascu, A.

论文摘要

我们表征了对电容偏置的弹性偏置超导电路的最低能量水平实现的QUTRIT的控制。 Qutrit Clifford组的随机基准测试的平均保真度为98.89 $ \ pm $ 0.05%。对于Clifford组的选定子集,我们执行量子过程断层扫描并观察重复的栅极序列的行为。每个QUTRIT门都是仅使用适用于任何统一的方法的两态旋转而生成的。我们发现,错误主要是由于变质而引起的,并且从级别的转移中产生了重大贡献。这项工作证明了高保真的QUTRIT控制,并概述了对超导Qudits最佳控制的未来工作的途径。

We characterize control of a qutrit implemented in the lowest three energy levels of a capacitively-shunted flux-biased superconducting circuit. Randomized benchmarking over the qutrit Clifford group yields an average fidelity of 98.89 $\pm$ 0.05%. For a selected subset of the Clifford group, we perform quantum process tomography and observe the behaviour of repeated gate sequences. Each qutrit gate is generated using only two-state rotations via a method applicable to any unitary. We find that errors are due to decoherence primarily and have a significant contribution from level shifts. This work demonstrates high-fidelity qutrit control and outlines avenues for future work on optimal control of superconducting qudits.

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